| 标题 |
Industrial-scale validation of lamellae thickness as a key structural descriptor for high-temperature and high-voltage performance of BOPP capacitor films |
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| DOI | |
| 其它 |
期刊:Chemical Engineering Journal 作者:Jin-Qin Wang; Han-Xiang Guo; Yan-Huang Huang; Qin Zhang; Ke Wang 出版日期:2026-09-01 |
| 求助人 | |
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(2025-6-4)