| 标题 |
Enhanced detection of unknown defect patterns on wafer bin maps based on an open-set recognition approach |
| 网址 | |
| DOI | |
| 其它 |
期刊:Computers in Industry 作者:Jin-Su Shin; Min-Joo Kim; B. Kim; Dong‐Hee Lee 出版日期:2024-11-14 |
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(2025-6-4)