| 标题 |
Mask-Conditioned Auto-Regressive Defect Synthesis and High-Fidelity Industrial Anomaly Generation—Case Study for Strip Steel Defect Detection |
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| DOI | |
| 其它 |
期刊:IEEE Transactions on Instrumentation and Measurement 作者:Qi Zhang; Xiaojun Wu; Qixun Yang; Michael Yu Wang 出版日期:2026-02-24 |
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(2025-6-4)