| 标题 |
Pixel-Level Assessment Model of Contamination Conditions of Composite Insulators Based on Hyperspectral Imaging Technology and a Semi-Supervised Ladder Network |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Dielectrics and Electrical Insulation 作者:Yixuan Kong; Yunpeng Liu; Jianghai Geng; Zhicheng Huang 出版日期:2022-12-01 |
| 求助人 | |
| 下载 |
PDF的下载单位、IP信息已删除
(2025-6-4)