| 标题 |
Intrinsic Planar Defects Govern Durability in Single-Crystal Ni-Rich Cathodes |
| 网址 | |
| DOI | |
| 其它 |
Intrinsic Planar Defects Govern Durability in Single-Crystal Ni-Rich Cathodes Tao Huang, Hehe Zhang, Pei Liu, et al. Journal of the American Chemical Society (JACS), 2026 DOI: 10.1021/jacs.6c08205 |
| 求助人 | |
| 下载 |
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(2025-6-4)