| 标题 |
Thermal-moisture interaction effects on delamination reliability of advanced fan-out packages |
| 网址 | |
| DOI | |
| 其它 |
期刊:Materials Science in Semiconductor Processing 作者:Meng-Kai Shih; Yihao Chen; Biao Ding; Chao-Ping Hsieh; I-Hung Lin; et al 出版日期:2025-09-16 |
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(2025-6-4)