| 标题 |
Failure mode analysis of oxide VCSELs in high humidity and high temperature |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Lightwave Technology 作者:Suning Xie; Robert W. Herrick; D. R. Chamberlin; S. J. Rosner; Scott A. McHugo; et al 出版日期:2003-04-01 |
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(2025-6-4)