| 标题 |
Wafer-scale waveguide sidewall roughness scattering loss characterization by image processing |
| 网址 | |
| DOI | |
| 其它 |
期刊:Optics Express 作者:Mohit Khurana; Sahar Delfan; Zhenhuan Yi 出版日期:2025-04-29 |
| 求助人 | |
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(2025-6-4)