| 标题 |
Deformation and crack growth in multilayered ceramic capacitor during thermal reflow process: numerical and experimental investigation |
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| DOI | |
| 其它 |
期刊:Microelectronics International 作者:Rilwan Kayode Apalowo; Aizat Abas; Zuraihana Bachok; Mohamad Fikri Mohd Sharif; Fakhrozi Che Ani; et al 出版日期:2024-04-12 |
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(2025-6-4)