| 标题 |
Development methods for metal oxide photoresists: a fundamental investigation using lithography simulations |
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| DOI | |
| 其它 |
期刊:Advances in Patterning Materials and Processes XLIII 作者:Craig D. Needham; Ulrich Welling; Amrit Narasimhan; Joren Wouters; Peter De Schepper; et al 出版日期:2026 |
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(2025-6-4)