| 标题 |
Clean room Airborne Molecular Contamination (AMC) on damascene Cu interconnects |
| 网址 | |
| DOI | |
| 其它 |
期刊:2007 International Symposium on Semiconductor Manufacturing 作者:Bill Brennan; Kin Sang Lam; Pete Beckage; Bryon Hance 出版日期:2008-02-11 |
| 求助人 | |
| 下载 |
PDF的下载单位、IP信息已删除
(2025-6-4)