| 标题 |
Parallel Test Strategy for Chiplet Testing for HPC/AI Devices - Leveraging Smartest 8 Interleaved Testflow Solution |
| 网址 | |
| DOI | |
| 其它 |
期刊:2026 Conference of Science and technology of Integrated Circuits (CSTIC) 作者:Zhang Jun; Vince Li 出版日期:2026-03-22 |
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(2025-6-4)