| 标题 |
Reliability Improvement of High Mobility Oxide TFTs Based on Hydrogen-Resistant PEALD Al2O3 Gate Insulators Grown with N2O Plasma |
| 网址 | |
| DOI | |
| 其它 |
期刊:ACS Applied Materials & Interfaces 作者:Sang‐Hyun Kim; Yoon-Seo Kim; Taewon Hwang; Tae Heon Kim; H.S. Koo; et al 出版日期:2025-02-20 |
| 求助人 | |
| 下载 | 该求助完结已超 24 小时,文件已从服务器自动删除,无法下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)