| 标题 |
Mechanism of Threshold Voltage Instability in Double Gate α-IGZO Nanosheet TFT Under Bias and Temperature Stress |
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| DOI | |
| 其它 |
期刊:IEEE Journal of the Electron Devices Society 作者:Muhammad Aslam; Shu-Wei Chang; Yi-Ho Chen; Yao‐Jen Lee; Yiming Li; et al 出版日期:2024-01-01 |
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(2025-6-4)