| 标题 |
Divide and conquer: Relating patent quality and value in a conceptual framework based on a systematic review |
| 网址 | |
| DOI | |
| 其它 |
期刊:International Journal of Management Reviews 作者:Srinivasan Ananthraman; Bart Cambré; Markus Kittler; Henry Delcamp 出版日期:2023-10-27 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人或该文件上传人下载。 |
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(2025-6-4)