| 标题 |
Engineering Interface Fixed Charges in AlON/SiO 2 via In Situ Nitrogen Doping: Toward Threshold-Voltage Matching for SiC CMOS |
| 网址 | |
| DOI | |
| 其它 |
期刊:ACS Applied Electronic Materials 作者:Hang Su; Cheng Zhang; Xuetong Zhou; Zhongyu Liu; Changzhe Zhao; et al 出版日期:2026-03-28 |
| 求助人 | |
| 下载 |
PDF的下载单位、IP信息已删除
(2025-6-4)