Lv5
1460 积分 2025-09-17 加入
Module-level material engineering for continued DRAM scaling
4天前
求助中
Engineering Interface Fixed Charges in AlON/SiO 2 via In Situ Nitrogen Doping: Toward Threshold-Voltage Matching for SiC CMOS
2个月前
已完结
Engineering Interface Fixed Charges in AlON/SiO 2 via In Situ Nitrogen Doping: Toward Threshold-Voltage Matching for SiC CMOS
2个月前
已关闭
Breakdown Characteristics of N2/O2 Mixtures at High Pressures in Alternating Non-Uniform Electric Fields
2个月前
已完结
Study of Wafer Arcing Defects on PECVD Low Deposition Rate TEOS Oxide Thin Film
2个月前
已完结
NO Plasma Treatment Effects on the Structural and Electrical Properties of PECVD-Grown SiO2 Films
2个月前
已完结
Low Temperature Silicon Dioxide Thin Films Deposited Using Tetramethylsilane for Stress Control and Coverage Applications
3个月前
已完结
Low Temperature Silicon Dioxide Thin Films Deposited Using Tetramethylsilane for Stress Control and Coverage Applications
3个月前
已完结
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