| 标题 |
Annular Bright-Field Scanning Transmission Electron Microscopy: Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials |
| 网址 | |
| DOI |
10.1017/s1551929517001006
doi
|
| 其它 |
期刊:Microscopy Today 作者:Scott D. Findlay; Naoya Shibata; Yuichi Ikuhara; Rong Huang; Eiji Okunishi; et al 出版日期:2017-10-27 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人或该文件上传人下载。 |
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(2025-6-4)