| 标题 |
Simulation study of the influence of ionizing irradiation on the single event upset vulnerability of static random access memory |
| 网址 | |
| DOI | |
| 其它 |
期刊:Acta Physica Sinica 作者: Ding Li-Li; Guo Hong-Xia; Chen Wei; Yan Yi-Hua; Xiao Yao; Fan Ru-Yu 出版日期:2013 |
| 求助人 | |
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