| 标题 |
Defect Diagnosis of AlGaN/GaN MIS-HEMTs With Multiple Field Plates Based on the Channel Depletion Behavior |
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| DOI | |
| 其它 |
期刊:IEEE Transactions on Electron Devices 作者:Youyang Wang; Jingwen Guan; Lanxin Huang; Yu‐Xiang Sun; Sheng Jiang; et al 出版日期:2025-01-01 |
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(2025-6-4)