| 标题 |
Interface-Engineered Ultrawide-Bandgap TiN/β-Ga 2 O 3 Schottky Diodes for Radiation-Hard X-ray Detection and Imaging |
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| DOI | |
| 其它 |
期刊:ACS Applied Electronic Materials 作者:Beomjun Park; Chowdam Venkata Prasad; Kanghee Shin; Seung-Hyun Park; Sun-June Kim; et al 出版日期:2026-04-20 |
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(2025-6-4)