| 标题 |
A Comprehensive Investigation of Threshold Voltage Shift in p-GaN HEMTs During PBTI Stress and Recovery at Cryogenic Temperatures |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Electron Devices 作者:Chuan Song; Wen Yang; Jianlang Liao; Peng Wu; Huaxing Jiang; Bin Li 出版日期:2026 |
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(2025-6-4)