| 标题 |
Exploiting Read Noise of Filamentary VCM ReRAM for Robust TRNG |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Electron Devices 作者:Kristoffer Schnieders; Peixuan Bai; Yongmin Wang; Tim Kempen; Alexandros Sarantopoulos; et al 出版日期:2025-09-26 |
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(2025-6-4)