| 标题 |
Investigation of the Interaction Effect Between the Microstructure Evolution and the Thermo-Mechanical Behavior of Cu-Filled Through Silicon Via |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Device and Materials Reliability 作者:S. B. Liang; C. Wei; C. B. Ke; S. Cao; M. B. Zhou; X. P. Zhang 出版日期:2022 |
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(2025-6-4)