| 标题 |
T pattern fuse construction in segment metallized film capacitors based on self-healing characteristics |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microelectronics Reliability 作者:Haoyuan Li; Hua Li; Zhiwei Li; Fuchang Lin; De Liu; et al 出版日期:2015-04-23 |
| 求助人 | |
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(2025-6-4)