| 标题 |
Characterization of CNT pellicles in an EUV scanner environment and strategies to extend pellicle durability |
| 网址 | |
| DOI |
10.1117/12.3076026
doi
|
| 其它 |
期刊:International Conference on Extreme Ultraviolet Lithography 2025 作者:Márcio Dias Lima; Hooman Rahmani; Takumi Furuya; Sergey Li; Toshiro Itani; et al 出版日期:2025-11-06 |
| 求助人 | |
| 下载 |
PDF的下载单位、IP信息已删除
(2025-6-4)