| 标题 |
Quantitative Imaging of Defect Distributions in CdZnTe Wafers Using Combined Deep-Level Photothermal Spectroscopy, Photocarrier Radiometry, and Lock-In Carrierography |
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| DOI | |
| 其它 |
期刊:ACS applied electronic materials 作者:Alexander Melnikov; Andreas Mandelis; Akshit Soral; Claudia Zavala-Lugo; Michael Pawlak 出版日期:2021-06-04 |
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(2025-6-4)