| 标题 |
Understanding and eliminating thermo-mechanically induced radial cracks in fully metallized through-glass via (TGV) substrates |
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| DOI | |
| 其它 |
期刊:Microelectronics Reliability 作者:Chukwudi Okoro; Shrisudersan Jayaraman; Scott Pollard 出版日期:2021-03-21 |
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(2025-6-4)