| 标题 |
A Wafer-Level Three-Dimensional Integration Scheme With Cu TSVs Based on Microbump/Adhesive Hybrid Bonding for Three-Dimensional Memory Application |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Device and Materials Reliability 作者:Cheng-Ta Ko; Zhi-Cheng Hsiao; Yao-Jen Chang; Peng-Shu Chen; Yu-Jiau Hwang; et al 出版日期:2012-04-20 |
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(2025-6-4)