| 标题 |
Selective plasma-enhanced atomic layer etching of ZrO2 over TiN for DRAM capacitor recess etching |
| 网址 | |
| DOI |
10.1117/12.3090682
doi
|
| 其它 |
期刊:Advanced Etch Technology and Process Integration for Nanopatterning XV 作者:Hyeon O. Lee; H. Chae 出版日期:2026-04-09 |
| 求助人 | |
| 下载 | 暂无链接,等待应助者上传 |
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(2025-6-4)