| 标题 |
Comparison of self-heating effect (SHE) in short-channel bulk and ultra-thin BOX SOI MOSFETs: Impacts of doped well, ambient temperature, and SOI/BOX thicknesses on SHE |
| 网址 | |
| DOI | |
| 其它 |
期刊:2013 IEEE International Electron Devices Meeting 作者:Tsunaki Takahashi; Takeo Matsuki; Takahiro Shinada; Yasuo Inoue; Ken Uchida 出版日期:2014-02-01 |
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(2025-6-4)