| 标题 |
A new approach to detect surface defects from 3D point cloud data with surface normal Gabor filter (SNGF) |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Manufacturing Processes 作者:Eddie Taewan Lee; Zhaoyan Fan; Burak Sencer 出版日期:2023-03-09 |
| 求助人 | |
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(2025-6-4)