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High resolution alpha particle detection using 4H–SiC epitaxial layers: Fabrication, characterization, and noise analysis |
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期刊:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 作者:Sandeep K. Chaudhuri; Kelvin J. Zavalla; Krishna C. Mandal 出版日期:2013-11-01 |
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(2025-6-4)