| 标题 |
Configurable gate driver for a stress test bench of newly developed discrete silicon power devices |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microelectronics Reliability 作者:K. Patmanidis; Tobias Kist; M. Glavanovics; A. Muetze 出版日期:2021-09-01 |
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(2025-6-4)