| 标题 |
Error sources, compensation, and probe path optimization for on-machine metrology of freeform optics |
| 网址 | |
| DOI | |
| 其它 |
期刊:Optical Manufacturing and Testing XIII 作者:Laura Hopper; Todd Noste; Jimmie Miller; Chris Evans; Rolf Rascher; Dae Wook Kim 出版日期:2020 |
| 求助人 | |
| 下载 |
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(2025-6-4)