| 标题 |
Evolution of the conductive filament system in HfO2-based memristors observed by direct atomic-scale imaging |
| 网址 | |
| DOI | |
| 其它 |
期刊:Nature Communications 作者:Ying Zhang; Ge-Qi Mao; Xiaolong Zhao; Yu Li; Meiyun Zhang; et al 出版日期:2021-12-13 |
| 求助人 | |
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(2025-6-4)