| 标题 |
A study on film thickness control of vertical flow showerhead reactor for RF plasma deposition |
| 网址 | |
| DOI |
10.23919/mipro.2017.7966580
doi
|
| 其它 |
期刊:International Convention on Information and Communication Technology, Electronics and Microelectronics 作者:Guensuk Lee; Suhong Kim; Seunghyun Seok; Jun-Sung Lee; Jin-Seok Lee; et al 出版日期:2017-05-01 |
| 求助人 | |
| 下载 |
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(2025-6-4)