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On the First Demonstration and Analysis of the HTGB Induced Electrical Degradation of High Voltage SiC IGBT Devices |
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期刊:2025 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia) 作者:Tuanzhuang Wu; Jiaxing Wei; Junhou Cao; Hao-Chun Fu; Zhaoxiang Wei; et al 出版日期:2025-08-15 |
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(2025-6-4)