| 标题 |
Roughness control in the processing of 2-inch polycrystalline diamond films on 4H-SiC wafers |
| 网址 | |
| DOI | |
| 其它 |
期刊:Materials Science in Semiconductor Processing 作者:Xiufei Hu; Ziang Wang; Yingnan Wang; Saibin Han; Xiaoyu Zhang; et al 出版日期:2024-12-01 |
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(2025-6-4)