| 标题 |
Understanding internal short circuit and thermal runaway of large-format Li-ion cells triggered by slow nail penetration through in situ diagnosis |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Power Sources 作者:Siyi Liu; Shan Huang; Qian Zhou; Kent Snyder; Mary K. Long; et al 出版日期:2025-05-16 |
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(2025-6-4)