| 标题 |
Detection of the Defective Vias in SIW Circuits From Single/Array Probe(s) Data Using Source Reconstruction Method and Machine Learning |
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| DOI | |
| 其它 |
期刊:IEEE Transactions on Microwave Theory and Techniques 作者:Rezvan Rafiee Alavi; Rashid Mirzavand; Ali Kiaee; Ruska Patton; Pedram Mousavi 出版日期:2019 |
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(2025-6-4)