| 标题 |
Preserving the Crystal Structure of Organic Semiconductors During Cross-Sectional Specimen Preparation for Transmission Electron Microscopy Using a Focused Ion Beam |
| 网址 | |
| DOI |
10.1093/mam/ozag090
doi
|
| 其它 |
期刊:Microscopy and Microanalysis 作者:Simon Hettler; Ute Zschieschang; Hagen Klauk; Martin Peterlechner; Yolita M Eggeler 出版日期:2026-08-01 |
| 求助人 | |
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(2025-6-4)