| 标题 |
Wafer-Scale Monolithic 3D Integration of CMOS Logic Gates Based on 2D Materials |
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| DOI | |
| 其它 |
期刊:2025 Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) 作者:Luhing Hu; Jaewoo Shim; Joonyun Kim; Hyeong-Seok Jang; Baekwon Park; Sang Won Kim 出版日期:2025-07-19 |
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(2025-6-4)