| 标题 |
Femtosecond X-ray Tracking of Oxygen Vacancy-Driven Shallow-to-Deep Trap Transition and Its Impact on Charge Carrier Dynamics in Blue TiO2 |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of the American Chemical Society 作者:Tae Gyun Woo; Woo Hyeok Kim; Sungin Yun; Haneol Oh; Junho Lee; et al 出版日期:2026-09-17 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)