| 标题 |
Impact of Back-Gate Modulation on High Normal Field Mobility in Extremely-Thin-Body SOI pMOSFETs |
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| DOI | |
| 其它 |
期刊:IEEE Transactions on Electron Devices 作者:Rui Su; Xinyi Zhang; Yi Jiang; Xinhuang Yang; Dawei Gao; et al 出版日期:2025-06-01 |
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(2025-6-4)