| 标题 |
Accurate lattice constants from multiple reflection measurements. II. Lattice constants of germanium silicon, and diamond |
| 网址 | |
| DOI |
10.1107/s0021889875010965
doi
|
| 其它 |
期刊:Journal of Applied Crystallography 作者:T. Hom; W. Kiszenik; B. Post 出版日期:1975-08-01 |
| 求助人 | |
| 下载 | 该求助完结已超 24 小时,文件已从服务器自动删除,无法下载。 |
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(2025-6-4)