| 标题 |
Test methods of total dose effects in verylarge scale integrated circuits |
| 网址 | |
| DOI | |
| 其它 |
期刊:Acta Physica Sinica 作者: He Chao-Hui; Geng Bin; He Bao-Ping; Yao Yu-Juan; Li Yong-Hong; et al 出版日期:2004 |
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