| 标题 |
Accurate thickness measurement method for thin layer in thick materials using terahertz technology |
| 网址 | |
| DOI | |
| 其它 |
期刊:Optics Express 作者:Sen-Cheng Zhong; Liang-Hui Du; Hu-Gui Jin; Zhao-Hui Zhai; Jiang Li; Li-Guo Zhu 出版日期:2025 |
| 求助人 | |
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(2025-6-4)