| 标题 |
Ultra-high thermal boundary conductance in wafer-scale Si/diamond integration via surface-activated bonding |
| 网址 | |
| DOI | |
| 其它 | Applied Surface Science 750, 167977. Online 29 July 2026. 当前出版标题以出版社为准;早期标题 Near-theoretical thermal boundary conductance in wafer-scale Si/diamond integration via surface-activated bonding 为同一 DOI。需要完整正文PDF。 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人或该文件上传人下载。 |
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(2025-6-4)