| 标题 |
Circuit-Level Reliability Analysis of CMOS Power Amplifiers: Impact of Harmonic-Induced Voltage Stress |
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| DOI | |
| 其它 |
期刊:IEEE Transactions on Microwave Theory and Techniques 作者:Donghwan Seo; Jaeyong Lee; Hojong Lee; Jinho Yoo; Changkun Park 出版日期:2026-08-01 |
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(2025-6-4)